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The European Physical Journal B
ISSN: 1434-6028 (printed version)
ISSN: 1434-6036 (electronic version)
Abstract Volume 5 Issue 3 (1998) pp 345-350
Super strong effect of surface impurities on the resistance and Hall effect of quench condensed Cs films
G. Bergmann (a), D. Garrett, D. Franks
Department of Physics, University of Southern California, Los Angeles, California 90089-0484, USA
Received: 8 January 1998 / Accepted: 17 March 1998
Abstract: Thin films of Cs, quench condensed onto a He cold quartz plate, possess electronic mean free paths which considerably exceed the film thicknesses. When theses films are covered in situ with sub monolayers of Au, Ag, In, Rh and Pb in the range between 0.01 and 1 monolayers the film resistance and the Hall constant increase dramatically. This corresponds to a scattering cross section of the surface impurities which is larger than 1 in units of $ 4\pi /k_{F}^{2}.$ Various models are explored to explain these unusual behavior. None yields a satisfactory explanation for this extremely strong effect of surface impurities on the resistance and the Hall effect.
PACS. 71.20.Dg Alkali and alkaline earth metals - 72.10.Fk Scattering by point defects, dislocations, surfaces, and other imperfections (including Kondo effect) - 73.50.Yg Other thin film transport-related topics
(a) email: bergmann@usc.edu
Article in PDF format (311 KB)
Online publication: October 26, 1998
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