Springer LINK: The European Physical Journal B - Abstract Volume 5 Issue 2 (1998) pp 159-162

The European Physical Journal B

ISSN: 1434-6028 (printed version)
ISSN: 1434-6036 (electronic version)

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Abstract Volume 5 Issue 2 (1998) pp 159-162

Penetration depth measurement in high quality $\mathsf{YBa_{2} Cu_{3} O_{7-x}}$thin films

E. Farber (1)(2) (a), G. Deutscher (1), J. P. Contour (3), E. Jerby (2)

(1) School of Physics and Astronomy, Raymond and Beverly Sackler Faculty of Exact Science, Tel Aviv University, Ramat Aviv 69978, Israel
(2) Department of Physical Electronics, Faculty of Engineering, Tel Aviv University, Ramat Aviv 69978, Israel
(3) UMR CNRS/Thomson-CSF,91404 Orsay, France

Received: 22 July 1997 / Revised: 11 March 1998 / Accepted: 23 June 1998

Abstract: The parallel plate resonator method has been used for measuring high quality $\mathrm{YBa_{2} Cu_{3} O}_{7-x}$ (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity vary linearly at low temperatures. The lowest penetration depth linear fitting has a slope value of $2.2 \mathrm{\text{\AA}/K}$ to $2.5 \mathrm{\text{\AA}/K}$ up to 20 K which is lower than previous measurements on YBCO single crystals. An interpretation of this smaller slope in terms of the generally accepted d-wave order parameter symmetry presents difficulties.

PACS. 74.25.Nf Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.) - 74.72.Bk Y-based cuprates - 74.76.Bz High-Tc films

(a) email: farber@post.tau.ac.il

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