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The European Physical Journal A
ISSN: 1434-6001 (printed version)
ISSN: 1434-601X (electronic version)
Abstract Volume 2 Issue 4 (1998) pp 337-342
short notes: Electron screening in backward elastic scattering
F. Schümann (1), S. Zavatarelli (2), L. Gialanella (1), U. Greife (1), M. Junker (1)(3), D. Rogalla (1), C. Rolfs (1), F. Strieder (1), H.P. Trautvetter (1)
(1) Institut für Physik mit Ionenstrahlen, Ruhr-Universität, Bochum, Universitätsstr. 150, D-44780 Bochum, Germany
(2) Dipartimento di Fisica, Università di Genova and INFN, Via Dolecaneso, I-16146 Genova, Italy
(3) Laboratori Nazionali del Gran Sasso, I-67010 Assergi, Italy
Received: 25 May 1998
Abstact: The elastic scattering cross sections, <sigma> (E,<theta>), for the systems He+Ta and He+W have been measured at <theta>lab=165° and Elab=76.1 keV to 3.988 MeV using targets with a thickness of a few atomic layers. The results are smaller than the results given by the Rutherford scattering law, <sigma>R(E,<theta>), due to the effects of electron screening and can be described by <sigma>(E,<theta>)/<sigma>R(E,<theta>)=(1+Ue/E)-1, where Ue is an atomic screening potential energy. The deduced average value, Ue=28 ± 3 keV, is consistent with the Moliére- and Lenz-Jensen-models as well as electron binding energies.
PACS: 25.60.Bx Elastic scattering
Communicated by B. Povh
Article in PDF-Format (408 KB)
Online publication: August 10, 1998
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